Electron and Ion Microscopy and Microanalysis: Principles and Applications, Lawrence E. Joseph Shamir Technion–Israel Institute of Technology Hafai, Israelĭavid S. Murphy JDS/Uniphase Bloomfield, Connecticutĭennis R. Hiroshi Murata The Furukawa Electric Co., Ltd. Mark Kuzyk Washington State University Pullman, Washington Corning, New YorkĬhris Dainty Imperial College of Science, Technology, and Medicine London, Englandīahram Javidi University of Connecticut Storrs, Connecticut Thompson University of Rochester Rochester, New YorkĮditorial Board Toshimitsu Asakura Hokkai-Gakuen University Sapporo, Hokkaido, Japan OPTICAL ENGINEERING Founding Editor Brian J. Current printing (last digit): 10 9 8 7 6 5 4 3 2 1 PRINTED IN THE UNITED STATES OF AMERICAĬopyright 2000 by Marcel Dekker, Inc. Neither this book nor any part may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopying, microfilming, and recording, or by any information storage and retrieval system, without permission in writing from the publisher. For more information, write to Special Sales/Professional Marketing at the headquarters address above. 270 Madison Avenue, New York, NY 10016 tel: 21 fax: 21 Eastern Hemisphere Distribution Marcel Dekker AG Hutgasse 4, Postfach 812, CH-4001 Basel, Switzerland tel: 41-6 fax: 41-6 World Wide Web http:/ /The publisher offers discounts on this book when ordered in bulk quantities. ISBN: 0-8247-8275-5 This book is printed on acid-free paper. TYSIN The University of North Carolina at Charlotte Charlotte, North CarolinaĬopyright 2000 by Marcel Dekker, Inc.
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |